Electronics & Semiconductors

The scale of semiconductor and electronic components requires microanalysis to visualize structures, check for quality, and identify contamination.  Microtrace utilizes techniques ranging from polarized light microscopy for characterization and measurement of the optical properties of films in screens, to high resolution electron microscopy for study and measurement of nanoscale layer structures in a range of components in LED dies.  Microanalytical methods with high spatial resolution such as Raman and infrared microspectroscopy, as well as UV imaging and elemental mapping, are some of the methods used to study, visualize and identify contaminants.

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