Nano- to Atomic Scale Imaging of Heavy Trace Metals Utilizing Advanced Microscopy Techniques
Utsunomiya, S., Palenik, C.S., and Ewing, R.C. (2004) Nano- to Atomic Scale Imaging of Heavy Trace Metals Utilizing Advanced Microscopy Techniques . The Dekker Encyclopedia of Nanoscience and Nanotechnology Marcel Dekker Pub., NY ISBN:978-0824750558).
Published on: 4/30/2004
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